IP.com is honored to present at the upcoming Patent Information Annual Conference (PIAC) of China 2017. The conference will take place September 5-6, 2017 in Bejing, China.
John Bonin, CEO of IP.com, will be presenting on the topic of Machine Learning, Artificial Intelligence, Deep Neural Networks: What Does It All Have To Do With Intellectual Property and Patent Analytics?
Machine learning is often described as a type of Artificial Intelligence technology that provides systems with the ability to learn without being explicitly programmed. Integrated analytics provide a basis on which data sets can be harnessed by machine learning algorithms to adapt and improve their performance.
Deep learning, a subset of machine learning, is proving to work especially well on patent classification. For years, patent analysts have been searching and reviewing terabytes of information searching not only patents and business documents, but also non-patent technical information. They hunt through data searching for prior art and patents of interest to assess their quality and to identify potential business partners or infringers. With the rapid increase in the number of patent and related documents worldwide, demand for broad and efficient concept searching, automatic clustering and categorization has grown significantly.
This presentation will look at how machine learning has enabled greater insights to be drawn from diverse IP data sets driving more efficient patent research, and providing comprehensive views on competitive intelligence, M&A activity and licensing targets.